Jeon, Sujin#, Soyeon Park#, Gyeongho Kim, Jiyeon Cheon, Sunghoon Lim†. “DOUBLE BLIND.” Expert Systems with Applications (Under Review)
Lim, Chansung#, Juhyun Kim#, Jiyeon Cheon, Gyeongho Kim†, Sunghoon Lim†. “Active learning for defect classification of wafer bin maps with near-out-of-distribution samples.” Advanced Engineering Informatics (Under Review)
Lim, Chansung, Gyeongho Kim†, and Sunghoon Lim†. "Open-set defect classification of wafer bin maps via multi-label evidential deep learning." Advanced Engineering Informatics (Under Review)